By W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)
In stable country physics and in fabrics technological know-how the research of the relationship among the homes of solids and their microstructure is of significant significance. For crystalline fabrics this connection is expounded to the lattice constitution, and it may be proven convinc ingly that the cloth homes depend upon deviations from the best lattice constitution within the majority of instances. as a result a competent detection and research of defects in "nearly excellent" crystals is critical, and a enough spatial solution of the tools utilized is needed. simply because electrons at the one hand strongly engage with the problem to be investigated and nevertheless can simply be centred electron-optical equipment are very constructive for this function. they're utilized in the diffraction mode, within the imaging mode and within the spectroscopic mode. The possible excessive lateral answer within the imaging mode makes the applying of electron microscopy in particular potent. even supposing already useful info on crystal defects could be received through the use of the regimen means of diffraction distinction imagingl-3) which has a solution of a few four 10 nm - within the specific weak-beam method ) of a few nm -, the detection of crystal defects and inhomogeneities, resp. on an atomic or molecular point via assistance from excessive solution electron microscopy will get expanding importance.
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Additional info for Analytical Methods High-Melting Metals
Proceeding to dislocations one can see from Table 2 that an unambiguous interpretation of high resolution images of such defects in general is only possible by the application of the exact structure imaging or - under special conditions - also by the many-beam imaging. The two-beam lattice fringe imaging of crystal defects can lead to wrong conclusions. As an example for this, Fig. 15 shows a defocus series of an end-on dislocation dipole in silicon taken by interference of the transmitted and the (111) diffracted beam.
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Congr. Electr. , The Hague 1980, Vo!. 304 107. : J. Solid State Chern. 14, 52 (1975) 108. , Allpress, J. : Acta Cryst. A30, 22 (1974) 109. : Phys. Status Solidi a 49, 337 (1978) 110. van Tendeloo, G. : Phys. Status Solidi a 47, 105 (1978) 111. : J. Microsc. Spectrosc. Electron. 6, 123 (1981) 112. Krivanek, O. , Maher, D. : App!. Phys. Lett. 32, 451 (1978) 113. : J. Phys. Chern. Solids 5, 129 (1958) 114. Salisbury, J. : J. Microsc. (London) 118, 75 (1980) 115. , Aseev, A. : Veroff. 10. Tag. Elektronenmikroskopie, Leipzig 1981, p.
Analytical Methods High-Melting Metals by W. Neumann, M. Pasemann, J. Heydenreich (auth.), Prof. Dr. H. C. Freyhardt (eds.)